Onderzoeker
Leen De Baets
- Disciplines:Scientific computing, Computertheorie, Computer hardware, Andere computer ingenieurswetenschappen, informatietechnologie en mathematische ingenieurswetenschappen
Affiliaties
- Vakgroep Informatietechnologie (Departement)
Lid
Vanaf4 jul 2014 → 23 sep 2018
Publicaties
1 - 10 van 17
- A voltage and current measurement dataset for plug load appliance identification in households(2020)
Auteurs: Roberto Medico, Leen De Baets, Jingkun Gao, Suman Giri, Emre Kara, Tom Dhaene, Chris Develder, Mario Berges, Dirk Deschrijver
- Accurate prediction of blood culture outcome in the intensive care unit using long short-term memory neural networks(2019)
Auteurs: Tom Van Steenkiste, Joeri Ruyssinck, Leen De Baets, Filip De Turck, Femke Ongenae, Tom Dhaene
Pagina's: 38 - 43 - Detection of unidentified appliances in non-intrusive load monitoring using siamese neural networks(2019)
Auteurs: Leen De Baets, Chris Develder, Tom Dhaene, Dirk Deschrijver
Pagina's: 645 - 653 - VI-based appliance classification using aggregated power consumption data(2018)
Auteurs: Leen De Baets, Tom Dhaene, Dirk Deschrijver, Mario Berges, Chris Develder
Pagina's: 179 - 186 - Appliance classification using VI trajectories and convolutional neural networks(2018)
Auteurs: Leen De Baets, Joeri Ruyssinck, Chris Develder, Tom Dhaene, Dirk Deschrijver
Pagina's: 32 - 36 - Machine learning for non-intrusive load monitoring(2018)
Auteurs: Leen De Baets
Aantal pagina's: 1 - On the Bayesian optimization and robustness of event detection methods in NILM(2017)
Auteurs: Leen De Baets, Joeri Ruyssinck, Chris Develder, Tom Dhaene, Dirk Deschrijver
Pagina's: 57 - 66 - Optimized statistical test for event detection in non-intrusive load monitoring(2017)
Auteurs: Leen De Baets, Joeri Ruyssinck, Chris Develder, Tom Dhaene, Dirk Deschrijver
Pagina's: 1 - 5 - Handling imbalance in an extended PLAID(2017)
Auteurs: Leen De Baets, G. Jingkun, Chris Develder, Tom Dhaene, M. Berges, Dirk Deschrijver
Pagina's: 32 - 36 - Automated classification of appliances using elliptical fourier descriptors(2017)
Auteurs: Leen De Baets, Chris Develder, Dirk Deschrijver, Tom Dhaene
Pagina's: 153 - 158