Researcher
Frank Welkenhuyzen
- Disciplines:Control systems, robotics and automation, Design theories and methods, Mechatronics and robotics, Computer theory, Manufacturing engineering, Other mechanical and manufacturing engineering, Product development
Affiliations
- Production Engineering, Machine Design and Automation (PMA) Section (Division)
Member
From4 Sep 2007 → 30 Mar 2016
Publications
1 - 10 of 25
- Investigation of the Accuracy of an X-ray CT Scanner for Dimensional Metrology with the Aid of Simulations and Calibrated Artifacts(2016)
Authors: Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
- Determination of Aspect Ratio Limitations, Accuracy and Repeatability of a Laser Line Scanning CMM Probe(2015)
Authors: Bart Boeckmans, Frank Welkenhuyzen, Jean-Pierre Kruth
Pages: 466 - 472 - Manufacturiing of uIM Mould Inserts with AMed Cooling Channels(2015)
Authors: Jun Qian, Karolien Kempen, Frank Welkenhuyzen, Wouter Vanderauwera, Jun Wang, Carry Yang, Jean-Pierre Kruth, Dominiek Reynaerts
Pages: 587 - 590 - Manufacturiing of uIM Mould Inserts with AMed Cooling Channels(2015)
Authors: Jun Qian, Karolien Kempen, Frank Welkenhuyzen, Wouter Vanderauwera, Jun Wang, Carry Yang, Jean-Pierre Kruth, Dominiek Reynaerts
Pages: 587 - 590 - Comparison of Aspect Ratio, Accuracy and Repeatability of a Laser Line Scanning Probe and a Tactile Probe(2014)
Authors: Bart Boeckmans, Frank Welkenhuyzen, Wim Dewulf, Jean-Pierre Kruth
- Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2014)
Authors: Ye Tan, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
- Dimensional accuracy of internal channels in SLM produced parts(2014)
Authors: Karolien Kempen, Frank Welkenhuyzen, Jun Qian, Jean-Pierre Kruth
Pages: 76 - 79 - Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Authors: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pages: 217 - 225 - Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2013)
Authors: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pages: 1 - 7 - Accuracy verification of a laser line scanner probe(2013)
Authors: Bart Boeckmans, Frank Welkenhuyzen, Jean-Pierre Kruth
Pages: 279 - 288