Researcher
Frank Welkenhuyzen
- Disciplines:Control systems, robotics and automation, Design theories and methods, Mechatronics and robotics, Computer theory, Manufacturing engineering, Other mechanical and manufacturing engineering, Product development
Affiliations
- Production Engineering, Machine Design and Automation (PMA) Section (Division)
Member
From4 Sep 2007 → 30 Mar 2016
Publications
11 - 20 of 25
- Defining the Optimal Beam Hardening Correction Parameters for CT Dimensional Metrology Applications(2013)
Authors: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pages: 137 - 143 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Authors: Frank Welkenhuyzen, Denis Indesteege, Bart Boeckmans, Kim Kiekens, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pages: 297 - 300 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Authors: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pages: 297 - 300 - Uncertainty Determination and Quantification for Dimensional Measurements with Industrial Computed Tomography(2013)
Authors: Wim Dewulf, Ye Tan, Frank Welkenhuyzen, Jean-Pierre Kruth
Pages: 535 - 538 - Simulation of X-ray projection images for dimensional CT metrology(2012)
Authors: Frank Welkenhuyzen, Bart Boeckmans, Jean-Pierre Kruth, Wim Dewulf, André Voet
Pages: 477 - 487 - A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology(2011)
Authors: Frank Welkenhuyzen, Ye Tan, Philip Bleys, André Voet, Jean-Pierre Kruth, Wim Dewulf
Pages: 1 - 7 - A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology(2011)
Authors: Kim Kiekens, Frank Welkenhuyzen, Ye Tan, Philip Bleys, André Voet, Jean-Pierre Kruth, Wim Dewulf
Pages: 1 - 7 - Influence of feature form deviations on CMM measurement uncertainties(2011)
Authors: Nick Van Gestel, Philip Bleys, Frank Welkenhuyzen, Jean-Pierre Kruth
Pages: 192 - 210 - A test object for calibration and accuracy assessment in X-ray CT metrology(2010)
Authors: Frank Welkenhuyzen, Ye Tan, Philip Bleys, André Voet, Wim Dewulf, Jean-Pierre Kruth
Pages: 528 - 531 - Evaluation and Implementation of an Integrated Measuring System within a Multi-tasking Machining Centre(2010)
Authors: Bert Lauwers, Jean-Pierre Kruth, Philip Bleys, Nick Van Gestel, Frank Welkenhuyzen
Pages: 233 - 238