Researcher
Kim Kiekens
- Disciplines:Mechatronics and robotics, Marine engineering
Affiliations
- Manufacturing Processes and Systems (MaPS) (Division)
Member
From1 Aug 2020 → 21 Sep 2016 - Mechanical Engineering Technology, Group T Leuven Campus (Technology cluster)
Member
From1 Oct 2013 → 21 Sep 2016 - Production Engineering, Machine Design and Automation (PMA) Section (Division)
Member
From1 May 2009 → 30 Sep 2013
Publications
1 - 10 of 10
- Contributions to Performance Verification and Uncertainty Determination of Industrial Computed Tomography for Dimensional Metrology(2017)
Authors: Kim Kiekens, Jean-Pierre Kruth, Wim Dewulf
- Proceedings of iCT2017 - 7th Conference on Industrial Computed Tomography(2017)
Authors: Wim Dewulf, Kim Kiekens
- Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Authors: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pages: 217 - 225 - Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2013)
Authors: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pages: 1 - 7 - Defining the Optimal Beam Hardening Correction Parameters for CT Dimensional Metrology Applications(2013)
Authors: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pages: 137 - 143 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Authors: Frank Welkenhuyzen, Denis Indesteege, Bart Boeckmans, Kim Kiekens, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pages: 297 - 300 - A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology(2011)
Authors: Kim Kiekens, Frank Welkenhuyzen, Ye Tan, Philip Bleys, André Voet, Jean-Pierre Kruth, Wim Dewulf
Pages: 1 - 7 - Material Dependent Thresholding for Dimensional X-ray Computed Tomography(2011)
Authors: Ye Tan, Kim Kiekens, Jean-Pierre Kruth, André Voet, Wim Dewulf
- Time-to-market van producten drastisch ingekort met CT-scannen(2009)
Authors: Kim Kiekens, Frank Welkenhuyzen, Philip Bleys
Pages: 25 - 26 - Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies(2009)
Authors: Frank Welkenhuyzen, Kim Kiekens, Wim Dewulf, Philip Bleys, Jean-Pierre Kruth, André Voet
Pages: 401 - 410