Onderzoeker
Frank Welkenhuyzen
- Disciplines:Controlesystemen, robotica en automatisatie, Ontwerptheorieën en -methoden, Mechatronica en robotica, Computertheorie, Productietechnieken, Andere mechanische en productie ingenieurswetenschappen, Productontwikkeling
Affiliaties
- Afdeling Productietechnieken, Machinebouw en Automatisering (Afdeling)
Lid
Vanaf4 sep 2007 → 30 mrt 2016
Publicaties
1 - 10 van 26
- Investigation of the Accuracy of an X-ray CT Scanner for Dimensional Metrology with the Aid of Simulations and Calibrated Artifacts(2016)
Auteurs: Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
- Determination of Aspect Ratio Limitations, Accuracy and Repeatability of a Laser Line Scanning CMM Probe(2015)
Auteurs: Bart Boeckmans, Frank Welkenhuyzen, Jean-Pierre Kruth
Pagina's: 466 - 472 - Manufacturiing of uIM Mould Inserts with AMed Cooling Channels(2015)
Auteurs: Jun Qian, Karolien Kempen, Frank Welkenhuyzen, Wouter Vanderauwera, Jun Wang, Carry Yang, Jean-Pierre Kruth, Dominiek Reynaerts
Pagina's: 587 - 590 - Manufacturiing of uIM Mould Inserts with AMed Cooling Channels(2015)
Auteurs: Jun Qian, Karolien Kempen, Frank Welkenhuyzen, Wouter Vanderauwera, Jun Wang, Carry Yang, Jean-Pierre Kruth, Dominiek Reynaerts
Pagina's: 587 - 590 - Comparison of Aspect Ratio, Accuracy and Repeatability of a Laser Line Scanning Probe and a Tactile Probe(2014)
Auteurs: Bart Boeckmans, Frank Welkenhuyzen, Wim Dewulf, Jean-Pierre Kruth
- Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2014)
Auteurs: Ye Tan, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
- Dimensional accuracy of internal channels in SLM produced parts(2014)
Auteurs: Karolien Kempen, Frank Welkenhuyzen, Jun Qian, Jean-Pierre Kruth
Pagina's: 76 - 79 - Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 217 - 225 - Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 217 - 225 - Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2013)
Auteurs: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 1 - 7