Researcher
Ye Tan
- Disciplines:Mechatronics and robotics, Marine engineering
Affiliations
- Manufacturing Processes and Systems (MaPS) (Division)
Member
From1 Aug 2020 → 31 May 2015 - Mechanical Engineering Technology, Group T Leuven Campus (Technology cluster)
Member
From29 Sep 2014 → 31 May 2015
Publications
1 - 10 of 15
- Scanning and Post-processing Parameter Optimization for CT DimensionalMetrology(2015)
Authors: Ye Tan, Jean-Pierre Kruth, Wim Dewulf
- Performance evaluation of CT measurements made on step gauges using statistical methodologies(2015)
Authors: Jean-Pierre Kruth, Ye Tan, Wim Dewulf
Pages: 68 - 72 - Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2014)
Authors: Ye Tan, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
- Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Authors: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pages: 217 - 225 - Engineering Experience - Building a Small Solar Vehicle(2013)
Authors: Pauwel Goethals, Peter Slaets, Yunhao Hu, Ye Tan, Maarten Vanierschot, Dries Haeseldonckx, Kathleen Denis
- Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2013)
Authors: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pages: 1 - 7 - Defining the Optimal Beam Hardening Correction Parameters for CT Dimensional Metrology Applications(2013)
Authors: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pages: 137 - 143 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Authors: Frank Welkenhuyzen, Denis Indesteege, Bart Boeckmans, Kim Kiekens, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pages: 297 - 300 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Authors: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pages: 297 - 300 - Uncertainty Determination and Quantification for Dimensional Measurements with Industrial Computed Tomography(2013)
Authors: Wim Dewulf, Ye Tan, Frank Welkenhuyzen, Jean-Pierre Kruth
Pages: 535 - 538