Automatic Defect-Oriented Test Generation for Analog and Mixed-Signal Integrated Circuits KU Leuven
The fabrication process of modern integrated circuits (ICs) is not perfect and the resulting manufacturing yield never reaches 100%. Therefore, manufactured ICs have to be tested in order to filter out the defective chips before they reach the electronic market. Therefore, solutions are needed to simultaneously improve the test coverages and reduce the time required to design these tests.
In this research, we develop a framework based ...