Researcher
Guido Groeseneken
- Disciplines:Modelling, Multimedia processing, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Other engineering and technology
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → Today - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From1 Jan 2008 → 31 Jul 2020 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 2001 → 30 Sep 2007
Projects
1 - 10 of 28 results
- Transient-induced Latchup (TLU) Exploration in System-Technology Co-Optimization (STCO) Scaling EraFrom4 Jun 2020 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Fundamental and practical aspects of gate oxide breakdown in VLSI technologies beyond 7nmFrom4 Dec 2019 → Today
- Physical modelling and optimization of ferroelectric FETs for memory applications.From10 May 2019 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Characterization and modelling of superconducting qubitsFrom31 Jan 2019 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- ESD Protection Design for RF & mm-Wave Circuits in CMOS TechnologiesFrom4 Sep 2018 → TodayFunding: Own budget, for example: patrimony, inscription fees, gifts
- Development of reliable gate stacks for stacked MOS devices in a 3D sequential integrationFrom26 Sep 2017 → 26 Sep 2021Funding: Own budget, for example: patrimony, inscription fees, gifts
- Unified Physics-Based Model of Degradation of FinFETs and Nanowire FETs for beyond 7 nm TechnologiesFrom21 Sep 2017 → TodayFunding: FWO fellowships
- Modelling, exploration and technology assessment of steep-subthreshold-slope transistors for N5/N3 CMOS power-performance scalingFrom31 Mar 2017 → 31 Mar 2021Funding: Own budget, for example: patrimony, inscription fees, gifts
- Reliability and Integration of GaN Power Devices and Circuits on GaN-on-SOIFrom24 Feb 2017 → 24 Nov 2020Funding: Own budget, for example: patrimony, inscription fees, gifts
- Feasibility of nanowire tunnel-FETs using dopant atoms for future ultra-low power CMOS-applications.From1 Oct 2016 → 2 Jun 2021Funding: FWO Strategic Basic Research Grant
Publications
1 - 10 of 539 results
- Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET(2021)
Authors: Zhicheng Wu, Jacopo Franco, Brecht Truijen, Philippe Roussel, Ben Kaczer, Dimitri Linten, Guido Groeseneken
Pages: 3246 - 3253Number of pages: 8 - Modeling and Calibration of Device Non-Idealities in Steep-Slope Devices(2021)
Authors: Jasper Bizindavyi, Guido Groeseneken, Bart Sorée
- Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics(2021)
Authors: Xiangdong Li, Niels Posthuma, Benoit Bakeroot, Hu Liang, Shuzhen You, Zhicheng Wu, Ming Zhao, Guido Groeseneken, Stefaan Decoutere
Pages: 4927 - 4930Number of pages: 4 - Modeling of Repeated FET Hot-Carrier Stress and Anneal Cycles Using Si-H Bond Dissociation/Passivation Energy Distributions(2021)
Authors: Michiel Vandemaele, Jacopo Franco, Stanislav Tyaginov, Guido Groeseneken, Ben Kaczer
Pages: 1454 - 1460Number of pages: 7 - GaN power IC design using the MIT virtual source GaNFET compact model with gate leakage and V-T instability effect(2021)
Authors: Shuzhen You, Xiangdong Li, Karen Geens, Niels Posthuma, Ming Zhao, Hu Liang, Guido Groeseneken, Stefaan Decoutere
Number of pages: 5 - High Speed MRAM with Voltage Control of Magnetic Anisotropy (VCMA) Effect(2021)
Authors: Yueh Chang Wu, Guido Groeseneken, Jan Van Houdt
- Reliability of p-GaN Gate HEMTs in Reverse Conduction(2021)
Authors: Deepthi Cingu, Xiangdong Li, Benoit Bakeroot, Nooshin Amirifar, Karen Geens, Kristof JP Jacobs, Ming Zhao, Shuzhen You, Guido Groeseneken, Stefaan Decoutere
Pages: 645 - 652Number of pages: 8 - Integration of GaN analog building blocks on p-GaN wafers for GaN ICs(2021)
Authors: Xiangdong Li, Karen Geens, Nooshin Amirifar, Ming Zhao, Shuzhen You, Niels Posthuma, Hu Liang, Guido Groeseneken, Stefaan Decoutere
Number of pages: 4 - Effects of Back-Gate Bias on the Mobility and Reliability of Junction-Less FDSOI Transistors for 3-D Sequential Integration(2021)
Authors: Zhicheng Wu, Jacopo Franco, Anne Vandooren, Philippe Roussel, Kaczer Ben, Dimitri Linten, Nadine Collaert, Guido Groeseneken
Pages: 464 - 470Number of pages: 7 - Compact Modeling of Multi-Domain Ferroelectric FETs: Charge Trapping, Channel Percolation and Nucleation-Growth Domain Dynamics(2021)
Authors: Yang Xiang, Marie Garcia Bardon, Ben Kaczer, Md Nur Kutubul Alam, Lars-Åke Ragnarsson, J Kaczmarek, Bertrand Parvais, Guido Groeseneken, J Van Houdt
Pages: 2107 - 2115