Reliability-aware simulation and validation for analog/mixed-signal circuits in sub-32nm CMOS KU Leuven
The Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) is an integral part of the electronics technology of today and is used on a daily basis by billions of users worldwide through personal computers, phones and cars, among others. Due to its massive usage, the reliability of the MOSFET is a critical part of its development and research. This study focuses on the
effects of random variability on the MOSFET and the evolution over ...