Towards improved atom probe tomography analysis of semiconductors : unraveling the dynamic evolution of the semiconductor emitter
A method for determining the shape of a sample tip for atom probe tomography using a scanning probe microscope and scanning probe microscope for performing said method.
A method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
Atom probe tomography data collection from DIN 1.4970 (15-15Ti) austenitic stainless steel irradiated with Fe ions