< Back to previous page
Researcher
Wilfried Vandervorst
- Disciplines:Applied mathematics in specific fields, Condensed matter physics and nanophysics, Atomic and molecular physics, Geophysics, Physical geography and environmental geoscience, Other earth sciences, Aquatic sciences, challenges and pollution, Geomatic engineering
Affiliations
- Quantum Solid State Physics (QSP) (Division)
Member
From1 Aug 2019 → Today - Nuclear and Radiation Physics (Division)
Member
From1 Oct 2007 → 31 Jul 2019 - Department of Electrical Engineering (ESAT) (Department)
Member
From1 Oct 1999 → 30 Sep 2007
Projects
1 - 10 of 34
- High lateral and depth resolution ion beam analysis of laterally confined nanostructuresFrom2 Sep 2019 → TodayFunding: FWO Strategic Basic Research Grant
- Self-focusing SIMS with in-situ SPM: a paradigm shift in 3D-metrologyFrom12 Oct 2018 → 13 May 2022Funding: Own budget, for example: patrimony, inscription fees, gifts
- Atom-by-atom analysis of advanced semiconductor devices: unraveling the physics of atom probe tomographyFrom20 Aug 2018 → 22 May 2019Funding: Own budget, for example: patrimony, inscription fees, gifts
- Nano-focused Raman spectroscopy for stress and compositional metrologyFrom31 Jul 2018 → 31 Jul 2022Funding: Own budget, for example: patrimony, inscription fees, gifts
- Laser-assisted atom probe tomography of oxide materials: Field evaporation mechanism study and performance improvementFrom15 May 2018 → 18 Dec 2020Funding: Own budget, for example: patrimony, inscription fees, gifts
- Atomic scale synthesis and atomic scale characterization of complex oxides with electronic/ionic conductivityFrom1 Jan 2018 → 31 Dec 2021Funding: FWO research project
- Metrology and physical mechanisms of 2D transition metal dichalcogenides and devices.From6 Nov 2017 → 31 Jan 2020Funding: Own budget, for example: patrimony, inscription fees, gifts
- Towards improved atom probe tomography analysis of semiconductors : unraveling the dynamic evolution of the semiconductor emitterFrom1 Sep 2017 → 31 Dec 2021Funding: FWO Strategic Basic Research Grant
- Fabrication and characterization of reference nano and micro structures for 3D chemical analysisFrom8 Feb 2017 → 8 Jul 2019Funding: Own budget, for example: patrimony, inscription fees, gifts
- Advanced methodology for the in-line electrical characterization of doped semiconductors in confined volumes.From1 Nov 2016 → 29 Aug 2023Funding: FWO Strategic Basic Research Grant
Publications
1 - 10 of 474
- Micro Four-Point Probe methodology for the in-line electrical characterization of semiconductors and metals in confined volumes(2023)
Authors: Steven Folkersma, Wilfried Vandervorst, Janusz Bogdanowicz
- Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN(2022)
Authors: Wilfried Vandervorst, Claudia Fleischmann
- Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry(2022)
Authors: Niels Claessens, Annelies Delabie, André Vantomme, Wilfried Vandervorst, Johannes Meersschaut
- Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study(2022)
Authors: Claudia Fleischmann, Wilfried Vandervorst
- OrbitrapTM-SIMS analysis of advanced semiconductor inorganic structures(2022)
Authors: Wilfried Vandervorst
- Off-axis Raman spectroscopy for nanoscale stress metrology(2022)
Authors: Claudia Fleischmann, Ingrid De Wolf, Wilfried Vandervorst
- A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography(2022)
Authors: Claudia Fleischmann, Wilfried Vandervorst
Pages: 1102 - 1115 - Ensemble RBS: Probing the compositional profile of 3D microscale structures(2022)
Authors: Niels Claessens, Wilfried Vandervorst, André Vantomme, Johannes Meersschaut
- Towards improved atom probe tomography analysis of semiconductors : unraveling the dynamic evolution of the semiconductor emitter(2021)
Authors: Jonathan Op de Beeck, Wilfried Vandervorst, Claudia Fleischmann
- The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes(2021)
Authors: Jeroen Scheerder, Wilfried Vandervorst, Claudia Fleischmann
Pages: 1 - 9
Patents
1 - 10 of 10
- Device for measuring surface characteristics of a material (Inventor)
- A device for measuring surface characteristics of a material (Inventor)
- Method and apparatus for transmission electron microscopy (Inventor)
- Characterization of regions with different crystallinity in materials (Inventor)
- A method and apparatus for transmission for transmission electron (Inventor)
- A device and method for two dimensional active carrier profiling of semiconductor components (Inventor)
- Method for differential heating of elongate nano-scaled structures (Inventor)
- Characterization of regions with different crystallinity in materials (Inventor)
- A method and apparatus for transmission electron microscopy (Inventor)
- Probe configuration and method of fabrication thereof (Inventor)