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Researcher
Marc FUHRMANN
- Keywords:Chemical engineering and applied chemistry
- Disciplines:Other materials engineering not elsewhere classified
Affiliations
- Engineering Materials and Applications (Research group)
Member
From16 May 2019 → 15 Feb 2024 - Engineering Technology (Department)
Member
From16 May 2019 → 15 Feb 2024 - Faculty of Engineering Technology (Faculty)
Member
From16 May 2019 → 15 Feb 2024 - Institute for Materials Research (Research institute)
Member
From16 May 2019 → 15 Feb 2024 - Materials and Packaging Research &Services (Research group)
Member
From16 May 2019 → 15 Feb 2021
Publications
1 - 7 of 7
- Development of topography-independent methods for the measurement of long-range forces in atomic force microscopy(2024)
Authors: Marc FUHRMANN, Ronald THOELEN
Number of pages: 142 - Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivity(2023)
Authors: Ian SACHS, Marc FUHRMANN, Wim DEFERME, Hildegard Moebius
- Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy(2022)
Authors: Marc FUHRMANN, Anna Musyanovych, Ronald THOELEN, Hildegard Moebius
- Inkjet‐Printed Lenses with Adjustable Contact Angle to Improve the Light Out‐Coupling of Organic Light‐Emitting Diodes(2021)
Authors: Ian SACHS, Marc FUHRMANN, Inge VERBOVEN, Indranil BASAK, Wim DEFERME, Hildegard Moebius
- Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic Crosstalk(2020)
Authors: Marc FUHRMANN, Anna Musyanovych, Ronald THOELEN, Sibylle von Bomhard, Hildegard Moebius
- The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy(2020)
Authors: Marc FUHRMANN, Alexander KRIVCOV, Anna Musyanovych, Ronald THOELEN, Hildegard Moebius
- Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy(2019)
Authors: Alexander KRIVCOV, Jasmin Ehrler, Marc FUHRMANN, Tanja JUNKERS, Hildegard Moebius
Pages: 1056 - 1064