Retrieving maximum structural information of beam-sensitive materials using low dose scanning transmission electron microscopy.

The properties of nanomaterials are controlled by their three-dimensional (3D) atomic structure. Nowadays, quantitative methods can be used to retrieve 3D atomic structural information from two-dimensional (2D) scanning transmission electron microscopy (STEM) images of materials which can withstand high electron doses. The goal of this project is to develop quantitative methods to estimate the atomic positions, atom types, and number of atoms from 2D STEM images recorded using a low electron dose.

Keywords:ELECTRON MICROSCOPY

Disciplines:Applied and interdisciplinary physics, Computational physics