< Back to previous page
Researcher
Annick De Backer
- Research Expertise:The research of Annick De Backer focuses on new developments in the field of model-based atomic resolution electron microscopy in two and three dimensions. The aim is a quantitative structure characterisation of nanostructures with the highest possible precision using advanced statistical techniques.
- Keywords:IMAGE PROCESSING, PARAMETER ESTIMATION, STATISTICAL DATA ANALYSIS, SOLID STATE PHYSICS, PHYSICS, NANOTECHNOLOGY, ELECTRON MICROSCOPY (QUANTITATIVE), Physics (incl. astronomy)
- Disciplines:Statistics, Modelling and simulation, Classical physics not elsewhere classified, Metrology, Quantum physics not elsewhere classified
- Research techniques:Use is made of statistical parameter estimation theory, image processing, statistical experimental design, and image formation in electron microscopy.
- Users of research expertise:Material scientists, physicist, engineers, biologists, geologists and other scientists extracting quantitative information from experimental measurements will benefit from a model-based analysis using statistical parameter estimation theory. Such analysis is especially important when parameters need to be determined at the limits of what is physically measurable.