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Publication

Nondestructive high-throughput sugar beet fruit analysis using X-ray CT and deep learning

Journal Contribution - Journal Article

Journal: Computers and Electronics in Agriculture

ISSN: 0168-1699

Volume: 200

Publication year:2022

Institutional Repository URL: https://lirias.kuleuven.be/3976372
DOI: https://doi.org/10.1016/j.compag.2022.107228
WoS Id: 000888186100004