< Back to previous page

Publication

Electron transport response de-embedding for high-speed image sensors

Journal Contribution - Journal Article Conference Contribution

Journal: OPTICAL AND INFRARED INTERFEROMETRY AND IMAGING VII
ISSN: 0277-786X
Volume: 10980
Publication year:2019
BOF-keylabel:yes
IOF-keylabel:yes
Authors from:Government, Higher Education

Authors/publisher

Research units

Events

  • Conference on Image Sensing Technologies - Materials, Devices, Systems, and Applications VI()

    MD, Baltimore