< Back to previous page

Publication

Dual-gate self-aligned a-InGaZnO transistor model for flexible circuit applications

Book Contribution - Book Chapter Conference Contribution

© 2019 EDAA. This work elaborates on an amorphous Indium-Gallium-Zinc Oxide thin-film transistor model for a dual-gate self-aligned transistor configuration, enabling the design and realization of complex integrated circuits. The model originates from a mobility-enhanced transistor behavior model, whereby the additional backgate impacts key parameters, such as threshold voltage, mobility and subthreshold slope. The model has been validated for the full design flow and compared to measurement results, from single transistors, to inverters, ring oscillators and RFID transponder chips.
Book: 2019 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
Pages: 25 - 29
Number of pages: 5
ISBN:9783981926323
Publication year:2019
BOF-keylabel:yes
IOF-keylabel:yes
Authors from:Government, Higher Education
Accessibility:Open