< Back to previous pagePublication Duality Patterns in 2-PCD Fragments Journal Contribution - Journal ArticleJournal: South American Journal of LogicISSN: 2446-6719Volume: 3Pages: 225 - 272Publication year:2017Institutional Repository URL: https://lirias.kuleuven.be/1819753VABB Id: c:vabb:452652 Accessibility:OpenAuthors/publisherHans Smessaert (First author)Lorenz Demey (Last author)Research unitsFormal and Computational Linguistics (ComForT), Leuven(Research group)KU LeuvenCentre for Logic and Philosophy of Science(Research unit)KU Leuven
