< Back to previous pagePublication Modeling of uniform switching RRAM devices and impact of critical defects Journal Contribution - Journal ArticleJournal: MICROELECTRONIC ENGINEERINGISSN: 0167-9317Issue: 97Volume: 93Pages: 178Institutional Repository URL: https://lirias.kuleuven.be/1734479Authors/publisherSubhali Subhechha (First author)Robin Degraeve (Author)Philippe Roussel (Author)Ludovic Goux (Author)Sergiu Clima (Author)Christina De Meyer (Author)Jan Van Houdt (Author)Gouri Sankar Kar (Last author)Research unitsAssociated Section of ESAT - INSYS, Integrated Systems(Division)KU LeuvenESAT- TELEMIC, Telecommunications and Microwaves(Division)KU Leuven
