< Back to previous pagePublication Automated Testing of Mixed-Signal Integrated Circuits by Topology Modification Book Contribution - Book Chapter Conference ContributionBook: 2015 IEEE VLSI Test Symposium (VTS)Pages: 1 - 6Publication year:2015WoS Id: 000380437500026Institutional Repository URL: https://lirias.kuleuven.be/handle/123456789/500457Authors/publisherAnthony Coyette (First author)Vahap Baris Esen (Author)Wim Dobbelaere (Author)Ronny Vanhooren (Author)Georges Gielen (Last author)Research unitsESAT - MICAS, Microelectronics and Sensors(Division)KU LeuvenEventsVLSI Test Symposium edition:33()Napa, California
