Smart strategies to break the beam damage limits in transmission electron microscopy.

The goal of this project is to develop and apply smart strategies, which are dedicated to characterise beam-sensitive nanostructures using quantitative scanning transmission electron microscopy imaging. This will allow one to use a minimum electron dose to detect single atoms, to determine their atom types and to precisely measure positions of atoms. In this manner, beam damage will be drastically reduced or will even be ruled out completely.

Keywords:BEAM DAMAGE, TRANSMISSION ELECTRON MICROSCOPY, PARAMETER ESTIMATION

Disciplines:Astronomy and space sciences, Condensed matter physics and nanophysics