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Project

Onderzoek naar volledige en nauwkeurige gedragsmodellen van microgolftransistoren.

Complete and accurate nonlinear models of microwave transistor are essential for the design of high-frequency electronic circuit. Among others, behavioral or black-box models have become very popular in the microwave engineering community. In particular, measurement-driven behavioral models have gained huge attention in the last decades. The aim of this research project is twofold and consists of: generation of behavioral models starting from vector calibrated nonlinear measurement systems. As opposed to the existing approaches, models will be generated by exploiting nonlinear measurements performed in both the low- (kHz-MHz) and high-frequency ranges.Study of the impact of measurement uncertainty on models parameters. This requires a preliminary analysis of the uncertainty affecting nonlinear measurement systems.
Date:1 Oct 2012 →  31 Dec 2017
Keywords:Nonlinear measurements, Nonlinear models, Microwave transistors, Measurement uncertainty
Disciplines:Thermodynamics