Element specific atom counting at the atomic scale by combining high angle annular dark field scanning transmission electron microscopy and energy dispersive X-ray spectroscopy Universiteit Antwerpen
A new methodology is presented to count the number of atoms in multimetallic nanocrystals by combining energy dispersive X-ray spectroscopy (EDX) and high angle annular dark field scanning transmission electron microscopy (HAADF STEM). For this purpose, the existence of a linear relationship between the incoherent HAADF STEM and EDX images is exploited. Next to the number of atoms for each element in the atomic columns, the method also allows ...