A 0.18-μm CMOS Image Sensor With PhaseDelay-Counting and Oversampling Dual-Slope Integrating Column ADCs Achieving 1e− rms Noise at 3.8-μs Conversion Time KU Leuven
© 2017 IEEE. A CMOS image sensor (CIS) is presented, simultaneously achieving low noise and high frame rate. The imager innovatively employs column-parallel dual-slope (DS) integrating analog-to-digital converters (ADCs) based on a phase-delay-counting principle and using oversampling to suppress the readout thermal noise. A noise analysis of the DS-integrating ADC in correlated-double-sampling operation is provided to prove the low-noise ...