Lifetime measurements on attached epilayers and detached epifoils grown on reorganised porous silicon showing a bulk lifetime exceeding 100 μs KU Leuven
This paper discusses on-going efforts towards reliable lifetime measurements on epilayers and the subsequent decoupling of the bulk and surface recombination components, both while it is still attached to the p+ substrate on which it is grown ("attached epilayer") and after its detachment from the substrate ("detached epifoil"). For the "attached epilayers", microwave photo conductance decay (μ-PCD) and simulation-assisted photoluminescence ...