Tamper-aware age sensor. Interuniversitair Micro-Electronica Centrum vzw
A sensor (100) for estimating the operating age of an integrated circuit (105) experiencing performance degradation and related tamper detection method are disclosed. The sensor (100) is operable in a regular use mode or in a readout mode and comprises a performance monitor (101) responsive to temperature stress and voltage stress, and an anneal monitor (102) responsive to temperature stress. The performance monitor (101) is configured to receive an operating voltage (V_OP) of the integrated circuit (105) when the sensor is operated in the regular use mode. Each anneal monitor (102) is a ...