Publicaties

The thin oxide layers forming on the metal surfaces of metals determine their interactions with the environment and have a strong influence on the materials properties such as corrosion resistance. Such oxide layers typically have a thickness in the range of a few nanometres, which is a challenge for the analysis of their chemical nature and structure. To characterize such materials and surfaces, XPS using depth profile sputtering is a sensitive ...

Data about the chemical status of poly(dimethylsiloxane) (PDMS) after nanosecond Q-switched Nd:YAG laser treatment with near infrared, visible and ultraviolet radiation are presented. The μ-Raman spectroscopy analyses reveal as irradiation result a new sharp peak of crystalline silicon. In addition, broad bands appear assigned to D band of amorphous carbon and G band of microcrystalline and polycrystalline graphite. The μ-Raman spectra are ...

The determination of functional groups on complex polymer surfaces by X-ray photoelectron spectroscopy (XPS) can be improved considerably by derivatization reactions. Simple polymers containing hydroxyl groups or amino groups were investigated as reference materials for the derivatization with trifluoroacetic anhydride (TFAA).

-1 Poly(vinyl alcohol) (PVA), poly(hydroxyethyl methacrylate) (PHEMA), poly(vinyl butyral) (PVB), ...

XPS was used as an evalution tool for nanoparticles in HTSC thin films. Ar-sputtering was used for depthprofiling and as such it was shown that this is a useful tool to evaluate the distribution of the nanoparticles within the thin film.