Pixel-wise beam-hardening correction for dark-field signal in X-ray dual-phase grating interferometry Interuniversitair Micro-Electronica Centrum vzw
The dark-field signal provided by X-ray grating interferometry is an invaluable tool for providing structural information beyond the direct spatial resolution and their variations on a macroscopic scale. However, when using a polychromatic source, the beam-hardening effect in the dark-field signal makes the quantitative sub-resolution structural information inaccessible. Especially, the beam-hardening effect in dual-phase grating interferometry ...