Publicaties
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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability Vrije Universiteit Brussel KU Leuven
A paradigm for MOSFET instabilities is outlined based on gate oxide traps and the detailed understanding of their properties. A model with trap energy levels in the gate dielectric and their misalignment with the channel Fermi level is described, offering the most successful strategy to reduce both Positive and Negative Bias Temperature Instability (PBTI and NBTI) in a range of gate stacks. Trap temporal properties are determined by tunneling ...
Functional and neurochemical interactions within the amygdala-medial prefrontal cortex circuit and their relevance to emotional processing KU Leuven
The amygdala-medial prefrontal cortex (mPFC) circuit plays a key role in emotional processing. GABA-ergic inhibition within the mPFC has been suggested to play a role in the shaping of amygdala activity. However, the functional and neurochemical interactions within the amygdala-mPFC circuits and their relevance to emotional processing remain unclear. To investigate this circuit, we obtained resting-state functional magnetic resonance imaging ...
Equivalent electrical circuits and their use across electrochemical impedance spectroscopy application domains Universiteit Gent
When studying electrochemical systems, EIS practitioners face the challenge of choosing a relevant equivalent electrical circuit to analyze their measurement data and interpreting the role of its components. In this review, we take a closer look at the use of equivalent electrical circuits (EEC) across various application domains. We aim to aid EIS practitioners in determining and evaluating their EEC-based data analysis methodology in light of ...
On the passivity of the quasi-static partial element equivalent circuit method Vrije Universiteit Brussel
Quantum circuit approximations and entanglement renormalization for the Dirac field in 1+1 dimensions Universiteit Gent
The multiscale entanglement renormalization ansatz describes quantum many-body states by a hierarchical entanglement structure organized by length scale. Numerically, it has been demonstrated to capture critical lattice models and the data of the corresponding conformal field theories with high accuracy. However, a rigorous understanding of its success and precise relation to the continuum is still lacking. To address this challenge, we provide ...
Model-Driven Design of Microwave Filters Based on Scalable Circuit Models Vrije Universiteit Brussel KU Leuven
Most microwave filters are currently designed using direct electromagnetic (EM) optimization. This method holds several disadvantages regarding the provided physical insight to designers and duration of the optimization process. To circumvent these drawbacks, we propose a filter design based on scalable circuit models. This model-driven design competes with EM optimization by maintaining the accuracy of the optimization results while providing a ...
Efficient statistical simulation of microwave devices via stochastic testing-based circuit equivalents of nonlinear components Universiteit Gent
Simulation of a non‐linear, time‐variant circuit using the Haar wavelet transform Universiteit Gent
Wavelet theory has disentangled numerous complexities, including those pertinent to transient and steady-state responses of systems, when Laplace and Fourier transforms face insoluble obstacles. Reactive linear components (e.g. inductors and capacitors) are typically handled in the frequency plane. Non-linear (e.g. diodes) or time-variant components (e.g. switches) are conventionally simulated in the time plane (e.g. a diode via its I-V ...
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis KU Leuven
© 2016 IEEE. A method is presented to address the automatic generation of test signals for analog and mixed-signal integrated circuits. No restriction on the number of inputs or the nonlin-earity of the circuit are made. The circuit under consideration is first decomposed into a set of sub-circuits, called blocks, in order to break down the complexity of the problem. The effect of a targeted fault is then automatically analyzed at the transistor ...