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Simulation of a circular phased array for a portable ultrasonic polar scan

Boekbijdrage - Boekhoofdstuk Conferentiebijdrage

The development of new composite materials, often anisotropic in nature, requires intricate approaches to characterize these materials and to detect internal defects. The Ultrasonic Polar Scan (UPS) is able to achieve both goals. During an UPS experiment, a material spot is insonified at several angles ( , ), after which the reflected or transmitted signal is recorded. While excellent results have been obtained using an in-house developed 5-axis scanner, UPS measurements with the current set-up are too lengthy and cumbersome for in-situ industrial application. Therefore, we propose to replace the complex mechanical steering of the transducers by a hemispherical phased array consisting of small PZT elements. This allows to create a compact and portable setup without compromising the current data quality. By successively activating a specific set of elements of the array and choosing appropriate inter-element time delays, the beam can be electronically steered from any angle to a fixed position on the targeted sample. Consequently, UPS reflection measurements can be performed at this position from a wide range of angles in a timeframe of seconds. Additionally, by using apodization windows, it is possible to efficiently reduce the intensity of unwanted side lobes and to create a phase profile which closely resembles that of a bounded plane wave, leading to an easier interpretation of the recorded data. The appropriate time delays and apodization parameters can be found though a multi-objective inverse problem in which both the phase profile and the side lobe reduction are optimized. This approach enables the creation of an effective beam profile to be used during UPS experiments for the characterization and inspection of composite materials. Our simulation approach is a crucial step towards a next-generation UPS device for industrial applications and in-field measurements.
Boek: AIP Conference Proceedings
Aantal pagina's: 10
ISBN:9780735416444
BOF-keylabel:ja
IOF-keylabel:ja
Authors from:Higher Education