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Real-Life Mission Profile Oriented Lifetime Estimation of a SiC Interleaved Bidirectional HV DC/DC Converter for Electric Vehicle Drivetrains

Tijdschriftbijdrage - Tijdschriftartikel

The rapid growth of Battery Electric Vehicles (BEVs) in the automotive field has led to a need for improving their drivetrain performance, mainly focusing on the extension of the battery operating range. However, the majority of performed technical assessments only consider battery SoC and depth of discharge while neglecting the effects on lifetime and failure probability of power electronic components, more specifically the emerging wide-bandgap-based (WBG) technologies. Toward fulfilling this gap, the EV market demands lifetime estimation performed under real-life mission profile to confirm efficiency and reliable operation of EV power electronics for an extended range meeting the EVs lifetime requirements. In this regard, the present study proposes a versatile experimental device-under-test setup to investigate a novel stepwise holistic system-level lifetime estimation approach for BEV drivetrains equipped with SiC interleaved bidirectional HV DC/DC converter (IBC). To this end, three different real-life mission profile use-cases are investigated in this paper and provides systematic stress-based lifetime estimation, statistical analyses, and validations in comparison. The study outcome highlights realistic information related to significant impacts of operation range and battery SoC features on the IBC lifetime from all aspects.

Tijdschrift: IEEE Journal of Emerging and Selected Topics in Power Electronics
ISSN: 2168-6777
Volume: 2021
Aantal pagina's: 25
Jaar van publicatie:2021
Trefwoorden:Aging, Batteries, battery pack SoC, component-level lifetime, Electric Vehicles, Estimation, interleaved DC/DC converter, Inverters, Monte Carlo optimization, Multichip modules, power electronics reliability, Real-life mission profile, SiC power modules, Silicon carbide, system-level lifetime, Weibull fit, Wires, Elektronica en elektrotechniek
  • ORCID: /0000-0002-3593-0748/work/96054541
  • ORCID: /0000-0001-7663-4948/work/96054466
  • ORCID: /0000-0002-9727-7844/work/96054339
  • ORCID: /0000-0002-6090-9609/work/96053771
  • ORCID: /0000-0002-8650-7341/work/96053431
  • DOI: https://doi.org/10.1109/jestpe.2021.3083198