Multi-view wide baseline depth estimation robust to sparse input sampling

In this paper, we propose a depth map estimation algorithm, based on Epipolar Plane Image (EPI) line extraction, that is able to correctly handle partially occluded objects in wide baseline camera setups. Furthermore, we introduce a descriptor matching technique to reduce the negative influence of inaccurate color correction and similarly textured objects on the depth maps. A visual comparison between an existing EPI-line extraction algorithm and our method is provided, showing that our method provides more accurate and consistent depth maps in most cases.

ISBN:9781509033133

Jaar van publicatie:2016

Trefwoorden:Depth Maps, Occlusions, Color Inconsistencies, Epipolar Plane Image, Light Fields

BOF-keylabel:ja

IOF-keylabel:ja

Toegankelijkheid:Closed