Publicatie

Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering

Tijdschrift: NANOSCALE

ISSN: 2040-3364

Issue: 24

Volume: 6

Pagina's: 14991 - 14998

Jaar van publicatie:2014

BOF-keylabel:ja

IOF-keylabel:ja

BOF-publication weight:6

CSS-citation score:2

Auteurs:International

Authors from:Higher Education

Toegankelijkheid:Closed