Lage dosis beeldvorming in transmissie elektronen microscopie door gecomprimeerde detectie.

Transmission electron microscopy (TEM) has provided scientists with a view on the atomic structure of materials for many decades. As instruments improved dramatically, the damage incurred by bombarding the material with electrons has become a major obstacle in the quest for more information from ever smaller nanomaterials. In short, the material rather than the microscope has become the limiting factor to further progress. In this project we propose to apply recent insights from the field of data compression to overcome this hurdle. In essence, we will develop the instrumentation for the recording of a subset of a microscopy image while still being able to reconstruct the whole image. We use the fact that images, unlike random signals, possess a level of predictability. The reason this works is the same as why holiday pictures can be compressed for storage without losing their information content. The difference between compression algorithms and this so-called compressed sensing approach is that rather than storage space reduction, we gain a reduction in the electron dose needed to obtain an image, reducing the damage that is blocking further progress in TEM. The project builds on the recent implementation of a prototype and will explore the benefits of this approach from both a theoretical and experimental point of view with the aim to demonstrate a significant improvement in the performance of TEM on materials that previously were damaged before an image could be taken

Trefwoorden:TRANSMISSIE ELEKTRONENMICROSCOPIE

Disciplines:Klassieke fysica, Elementaire deeltjesfysica en hoge-energie fysica, Andere fysica