Onderzoeker
Ye Tan
- Disciplines:Mechatronica en robotica, Mariene ingenieurskunde
Affiliaties
- Maakprocessen en -Systemen (MaPS) (Afdeling)
Lid
Vanaf1 aug 2020 → 31 mei 2015 - Werktuigkundige Industriële Ingenieurstechnieken, Campus Groep T Leuven (Technologiecluster)
Lid
Vanaf29 sep 2014 → 31 mei 2015
Publicaties
1 - 10 van 16
- Scanning and Post-processing Parameter Optimization for CT DimensionalMetrology(2015)
Auteurs: Ye Tan, Jean-Pierre Kruth, Wim Dewulf
- Performance evaluation of CT measurements made on step gauges using statistical methodologies(2015)
Auteurs: Jean-Pierre Kruth, Ye Tan, Wim Dewulf
Pagina's: 68 - 72 - Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2014)
Auteurs: Ye Tan, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
- Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 217 - 225 - Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 217 - 225 - Engineering Experience - Building a Small Solar Vehicle(2013)
Auteurs: Pauwel Goethals, Peter Slaets, Yunhao Hu, Ye Tan, Maarten Vanierschot, Dries Haeseldonckx, Kathleen Denis
- Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2013)
Auteurs: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 1 - 7 - Defining the Optimal Beam Hardening Correction Parameters for CT Dimensional Metrology Applications(2013)
Auteurs: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 137 - 143 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Auteurs: Frank Welkenhuyzen, Denis Indesteege, Bart Boeckmans, Kim Kiekens, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 297 - 300 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 297 - 300