Wim Dehaene

Bridging the Gap between Secondary and Higher STEM Education – the Case of STEM@school(2020)

Tijdschrift: European Review

ISSN: 1062-7987

Issue: S1

Volume: 28

Auteurs: Jolien De Meester, Jelle Boeve-de Pauw, Marie-Paule Buyse, Stijn Ceuppens, Mieke De Cock, Haydée De Loof, Leen Goovaerts, Luc Hellinckx, Heidi Knipprath, Annemie Struyf, et al.

Pagina's: S135 - S157

Aantal pagina's: 16

Completion Detection-Based Timing Error Detection and Correction in a Near-Threshold RISC-V Microprocessor in FDSOI 28 nm(2020)

Tijdschrift: IEEE Solid-State Circuits Letters

Volume: 3

Auteurs: Roel Uytterhoeven, Wim Dehaene

Pagina's: 230 - 233

A 5GS/s 7.2 ENOB Time-Interleaved VCO-based ADC Achieving 30.5fJ/cs(2020)

Tijdschrift: IEEE Journal of Solid-State Circuits

ISSN: 0018-9200

Issue: 6

Volume: 55

Auteurs: Maarten Baert, Wim Dehaene

Pagina's: 1577 - 1587

Aantal pagina's: 11

Modeling and Demonstration of Oxygen Vacancy-Based RRAM as Probabilistic Device for Sequence Learning(2020)

Tijdschrift: IEEE Transactions on Electron Devices

ISSN: 0018-9383

Issue: 2

Volume: 67

Auteurs: Jonas Doevenspeck, Robin Degraeve, Andrea Fantini, Peter Debacker, Diederik Verkest, Rudy Lauwereins, Wim Dehaene

Pagina's: 505 - 511

Aantal pagina's: 7

Performance Comparison of s-Si, In0.53Ga0.47As, Monolayer BP, and WS2-Based n-MOSFETs for Future Technology Nodes-Part I: Device-Level Comparison(2019)

Tijdschrift: IEEE Transactions on Electron Devices

ISSN: 0018-9383

Issue: 8

Volume: 66

Auteurs: Tarun Kumar Agarwal, Martin Rau, Iuliana Radu, Mathieu Luisier, Wim Dehaene, Marc Heyns

Pagina's: 3608 - 3613

Aantal pagina's: 6

Security on Plastics: Fake or Real?(2019)

Tijdschrift: Transactions on Cryptographic Hardware and Embedded Systems

ISSN: 2569-2925

Issue: 4

Volume: 2019

Auteurs: Nele Mentens, Jan Genoe, Thomas Vandenabeele, Lynn Verschueren, Dirk Smets, Wim Dehaene, Kris Myny

Aantal pagina's: 16

Sense amplifier offset voltage analysis for both time-zero and time-dependent variability(2019)

Tijdschrift: Microelectronics Reliability

ISSN: 0026-2714

Volume: 99

Auteurs: Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene

Pagina's: 52 - 61

Aantal pagina's: 10

Performance Comparison of s-Si, In0.53Ga0.47As, Monolayer BP- and WS2-Based n-MOSFETs for Future Technology Nodes-Part II: Circuit-Level Comparison(2019)

Tijdschrift: IEEE Transactions on Electron Devices

ISSN: 0018-9383

Issue: 8

Volume: 66

Auteurs: Tarun Kumar Agarwal, Martin Rau, Iuliana Radu, Mathieu Luisier, Wim Dehaene, Marc Heyns

Pagina's: 3614 - 3619

Aantal pagina's: 6

Teachers’ attitudes toward teaching integrated STEM: The impact of personal background characteristics and school context(2019)

Tijdschrift: International Journal of Science & Mathematics Education

ISSN: 1571-0068

Issue: 5

Volume: 17

Auteurs: Lieve Thibaut, Heidi Knipprath, Wim Dehaene, Fien Depaepe

Pagina's: 987 - 1007

Organic Photolithography for Displays with Integrated Fingerprint Scanner(2019)

Tijdschrift: SID symposium digest of technical papers

ISSN: 2168-0159

Volume: 50

Auteurs: Pawel E Malinowski, Tung-Huei Ke, Hylke Akkerman, Atsushi Nakamura, Albert van Breemen, Dieter Vander Velpen, Erwin Vandenplas, Moreno Hagelsieb, Lynn Verscheuren, Jan Genoe, et al.

Pagina's: 1007 - 1010

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