< Terug naar vorige pagina
Onderzoeker
Seyedeh Sahar Sahhaf
- Disciplines:Andere ingenieurswetenschappen en technologie, Sensoren, biosensoren en slimme sensoren, Andere elektrotechniek en elektronica, Modellering, Multimediaverwerking
Affiliaties
- Departement Elektrotechniek (ESAT) (Departement)
Lid
Vanaf1 sep 2006 → 31 aug 2010
Publicaties
1 - 8 van 8
- Modelling of charge trapping/Detrapping induced voltage instability in high-k Gate dielectrics(2012)
Auteurs: Seyedeh Sahar Sahhaf, Kris De Brabanter, Johan Suykens, Bart De Moor, Guido Groeseneken
Pagina's: 152 - 157 - Review of reliability issues in high k/metal gate stacks
Auteurs: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pagina's: 239 - 244 - Evidence of a new degradation mechanism in high-k dielectrics at elevated temperatures
Auteurs: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pagina's: 493 - 498 - Ion-implantation-based low-cost Hk/MG process for CMOS low-power application
Auteurs: Seyedeh Sahar Sahhaf, Matthieu Gilbert, Guido Groeseneken, Wilfried Vandervorst
Pagina's: 185 - 186 - Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
Auteurs: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pagina's: 272 - 274 - Profiling different kind of generated defects at elevated temperatures in both SiO2 and high-k dielectrics
Auteurs: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pagina's: 55 - 60 - Interpretation of PBTI/ TDDB predicted lifetime based on trap characterization by TSCIS in Vth-adjusted transistors
Auteurs: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pagina's: 1078 - 1081 - A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
Auteurs: Seyedeh Sahar Sahhaf, Guido Groeseneken
Pagina's: 1424 - 1432