- Machine learning based error detection in transient susceptibility tests(2019)
Auteurs: Roberto Medico, Niels Lambrecht, Hugo Pues, Dries Vande Ginste, Dirk Deschrijver, Tom Dhaene, Domenico Spina
Pagina's: 352 - 360
- A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test(2018)
Auteurs: Niels Lambrecht, H. Pues, Daniël De Zutter, Dries Vande Ginste
Pagina's: 858 - 865
- Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits(2018)
Auteurs: Niels Lambrecht
- Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices(2017)
Auteurs: Niels Lambrecht, H Pues, Daniël De Zutter, Dries Vande Ginste
Pagina's: 541 - 544
- Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test(2017)
Auteurs: Niels Lambrecht, Daniël De Zutter, Dries Vande Ginste, Hugo Pues
Pagina's: 1 - 5
- Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices(2016)
Auteurs: Niels Lambrecht, C. Gazda, H. Pues, Daniël De Zutter, Dries Vande Ginste
Pagina's: 971 - 980