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Onderzoeker
Marko Simicic
- Disciplines:Nanotechnologie, Sensoren, biosensoren en slimme sensoren, Andere elektrotechniek en elektronica, Ontwerptheorieën en -methoden
Affiliaties
- Elektronische Circuits en Systemen (ECS) (Afdeling)
Lid
Vanaf1 aug 2020 → 30 sep 2018 - Afdeling ESAT - MICAS, Micro-elektronica en Sensoren (Afdeling)
Lid
Vanaf1 dec 2012 → 30 sep 2018
Projecten
1 - 1 of 1
- Betrouwbaarheids-bewuste simulaties en validatie voor analoge/mixed-signal schakelingen in sub-32nm CMOSVanaf3 sep 2013 → 29 aug 2018Financiering: Eigen Middelen zoals patrimonium, inschrijvingsgelden, giften, ....
Publicaties
1 - 10 van 18
- Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations(2019)
Auteurs: Marko Simicic, Georges Gielen
Pagina's: 601 - 610 - Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD using TLP(2019)
Auteurs: Roman Boschke, Marko Simicic, Kris Myny, Peter Hellings
Aantal pagina's: 6 - Reliability-aware simulation and validation for analog/mixed-signal circuits in sub-32nm CMOS(2018)
Auteurs: Marko Simicic, Georges Gielen, Guido Groeseneken
- Comphy - A compact-physics framework for unified modeling of BTI(2018)
Auteurs: G Rzepa, J Franco, B O'Sullivan, A Subirats, Marko Simicic, G Hellings, P Weckx, M Jech, T Knobloch, M Waltl, et al.
Pagina's: 49 - 65 - Self-heating-aware CMOS reliability characterization using degradation maps(2018)
Auteurs: Kent Chuang, Marko Simicic
Pagina's: 2A.31 - 2A.36 - A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability(2018)
Auteurs: Vamsi Putcha, Marko Simicic, Francky Catthoor
Pagina's: 186 - 194 - A fully-integrated method for RTN parameter extraction(2017)
Auteurs: Marko Simicic, Guido Groeseneken, Georges Gielen
Pagina's: T132 - T133Aantal pagina's: 2 - Defect-based compact modeling for RTN and BTI variability(2017)
Auteurs: Marko Simicic
Aantal pagina's: 6 - Statistical assessment of the full VG/VD degradation space using dedicated device arrays(2017)
Auteurs: Kent Chuang, Marko Simicic, Guido Groeseneken
Pagina's: 2 - Benchmarking time-dependent variability of junctionless nanowire FETs(2017)
Auteurs: Vamsi Putcha, Marko Simicic
Pagina's: 2