Onderzoeker
Kim Kiekens
- Disciplines:Mechatronica en robotica, Mariene ingenieurskunde
Affiliaties
- Maakprocessen en -Systemen (MaPS) (Afdeling)
Lid
Vanaf1 aug 2020 → 21 sep 2016 - Werktuigkundige Industriële Ingenieurstechnieken, Campus Groep T Leuven (Technologiecluster)
Lid
Vanaf1 okt 2013 → 21 sep 2016 - Afdeling Productietechnieken, Machinebouw en Automatisering (Afdeling)
Lid
Vanaf1 mei 2009 → 30 sep 2013
Publicaties
1 - 10 van 11
- Contributions to Performance Verification and Uncertainty Determination of Industrial Computed Tomography for Dimensional Metrology(2017)
Auteurs: Kim Kiekens, Jean-Pierre Kruth, Wim Dewulf
- Proceedings of iCT2017 - 7th Conference on Industrial Computed Tomography(2017)
Auteurs: Wim Dewulf, Kim Kiekens
- Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 217 - 225 - Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications(2014)
Auteurs: Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 217 - 225 - Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology(2013)
Auteurs: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 1 - 7 - Defining the Optimal Beam Hardening Correction Parameters for CT Dimensional Metrology Applications(2013)
Auteurs: Ye Tan, Kim Kiekens, Frank Welkenhuyzen, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 137 - 143 - ACCURACY STUDY OF A 450 KV CT SYSTEM WITH A CALIBRATED TEST OBJECT(2013)
Auteurs: Frank Welkenhuyzen, Denis Indesteege, Bart Boeckmans, Kim Kiekens, Ye Tan, Wim Dewulf, Jean-Pierre Kruth
Pagina's: 297 - 300 - A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology(2011)
Auteurs: Kim Kiekens, Frank Welkenhuyzen, Ye Tan, Philip Bleys, André Voet, Jean-Pierre Kruth, Wim Dewulf
Pagina's: 1 - 7 - Material Dependent Thresholding for Dimensional X-ray Computed Tomography(2011)
Auteurs: Ye Tan, Kim Kiekens, Jean-Pierre Kruth, André Voet, Wim Dewulf
- Time-to-market van producten drastisch ingekort met CT-scannen(2009)
Auteurs: Kim Kiekens, Frank Welkenhuyzen, Philip Bleys
Pagina's: 25 - 26