Onderzoeker

Evi Van Nechel

Trefwoorden:Informatie- en communicatietechnologie

Publicaties

1 - 7 of 7 results

A Wide-Band Equivalent Circuit Model for Single Slot Defected Ground Structures(2019)
Boek: IEEE workshop on Signal Propagation on Interconnects (SPI)
Auteurs: Evi Van Nechel, Francesco Ferranti, Yves Rolain, John Lataire
Aantal pagina's: 3
Model-Driven Design of Microwave Filters Based on Scalable Circuit Models(2018)
Tijdschrift: IEEE Transactions on Microwave Theory and Techniques
ISSN: 0018-9480
Issue: 10
Volume: 66
Auteurs: Evi Van Nechel, Francesco Ferranti, Yves Rolain, John Lataire
Pagina's: 4390-4396
Aantal pagina's: 7
Extracting Improved Figures of Merit for Characterizing Nonlinear Devices using Multisine Excitation Signals(2018)
Boek: 91st ARFTG Microwave Measurement Conference (ARFTG)
Auteurs: Evi Van Nechel, Yves Rolain, John Lataire
Aantal pagina's: 4
Efficient Design Optimization and Variability Analysis of Defected Ground Structure Filters Using Metamodels(2017)
Boek: 2017 IEEE MTT-S International Microwave and RF Conference (IMaRC)
Auteurs: Evi Van Nechel, Francesco Ferranti, John Lataire, Yves Rolain
Aantal pagina's: 4
A measurement-based error-vector-magnitude model to assess non linearity at the system level(2017)
Boek: 2017 IEEE MTT-S International Microwave Symposium, IMS 2017
Auteurs: Yves Rolain, Maral Zyari, Evi Van Nechel, Gerd Vandersteen
Pagina's: 1429-1432
Aantal pagina's: 4
A Tensor-Based Extension for the Multi-Line TRL Calibration(2016)
Tijdschrift: IEEE Transactions on Microwave Theory and Techniques
ISSN: 0018-9480
Issue: 7
Volume: 64
Auteurs: Yves Rolain, Mariya Kamenova Ishteva, Evi Van Nechel, Francesco Ferranti
Pagina's: 2121-2128
Multi-Line TRL Revisited(2015)
Boek: 85th ARFTG Conference, Measurements and Techniques for 5G Applications, May 22nd, 2015 - Phoenix, Arizona
Auteurs: Yves Rolain, Mariya Kamenova Ishteva, Evi Van Nechel, Francesco Ferranti
Aantal pagina's: 3

Onderzoeker

Evi Van Nechel

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