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Octrooi
Atomic force microscopy probes with an assembly of metal nanowires and dielectrophoretic method for attaching and detaching said metal nanowires to and from said probes
The present invention relates to (i) a commercially available atomic force microscopy cantilever with an assembly of chemically-synthesized noble metal nanowires attached to it, without the use of an adhesive, (ii) controllable methods to attach an assembly of chemically-synthesized noble metal nanowires to said cantilever and (iii) the use of the commercially available atomic force microscope cantilever with assembly of nanowires in techniques such as surface topographic scanning with atomic force microscopy, nanoscale chemical analysis using near-field optical microscopy and with particular reference to chemical analysis such as DNA mapping, mapping active sites of catalysts, evaluating anisotropy of surfaces and surface properties, such as graphene.
Octrooi-publicatienummer: WO2019008108
Jaar aanvraag: 2019
Jaar toekenning: 2020
Jaar van publicatie: 2019
Status: Aangevraagd
URI: link to Espacenet
Technologiedomeinen: Meting, Microstructuur en nanotechnologie
Gevalideerd voor IOF-sleutel: Ja
Toegewezen aan: Associatie KULeuven