< Terug naar vorige pagina

Publicatie

An Industry-Ready 200 mm p-GaN E-mode GaN-on-Si power Technology

Boekbijdrage - Boekhoofdstuk Conferentiebijdrage

© 2018 IEEE. Enhancement mode 650V rated p-GaN gate HEMTs are fabricated on 200 mm p+Si substrates by using an industrial, Au-free process. The devices show true e-mode performance, with a high Vtof 2.8 V, low off-state leakage current and are dynamic RDS-ONfree over the complete VDSand temperature range. High temperature reverse bias (HTRB) testing is done on-wafer and after packaging. For the first time, 650 V e-mode power HEMTs realized on 200 mm Si substrates, show industry ready device performance and pass 1008 hour reliability testing, at VGS=0 V, VDS=650 V.
Boek: PRODCEEDINGS OF THE 2018 IEEE 30TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD)
Pagina's: 284 - 287
Aantal pagina's: 4
ISBN:9781538629260
Jaar van publicatie:2018