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A fleet-wide approach for condition monitoring of similar machines using time-series clustering

Boekbijdrage - Boekhoofdstuk Conferentiebijdrage

© Springer Nature Switzerland AG 2019. The application of machine learning to fault diagnosis allows automated condition monitoring of machines, leading to reduced maintenance costs and increased machine availability. Traditional approaches train a machine learning algorithm to identify specific faults or operational settings. Therefore, these approaches cannot always cope with a dynamic industrial environment. However, an industrial installation often contains multiple machines of the same type, which enables a fleet-based analysis. This type of analysis compares machines to tackle the challenges of a dynamic environment. In this paper a novel method is proposed for analyzing a fleet of machines operating under similar conditions in the same area by using inter-machine comparisons. The proposed methodology consists of two steps. First, the inter-machine difference is calculated using dynamic time warping by using the amount of warping as measure. This method allows comparing the measured signals even when fluctuations are present. Second, a clustering method uses the inter-machine similarity to identify groups of machines that operate in a similar manner. The generation of a fault usually causes a change in the raw signals and diagnostic features. As a result, the inter-machine difference between the faulty machine and the rest of the fleet will increase, leading to the creation of a separate group that contains the faulty machine. The methodology is evaluated and validated on phase current signals measured on a fleet of electrical drivetrains, where a phase unbalance fault is introduced in some of the drivetrains for a specific time duration.
Boek: Proceedings of the 6th International Conference on Condition Monitoring of Machinery in Non-stationary Operations
Pagina's: 101 - 110
Aantal pagina's: 10
ISBN:978-3-030-11220-2
Jaar van publicatie:2018
BOF-keylabel:ja
IOF-keylabel:ja
Authors from:Government, Private, Higher Education
Toegankelijkheid:Open