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Publicatie
Measuring and Simulating EMI on Very Small Components at High Frequencies
Boekbijdrage - Boekhoofdstuk Conferentiebijdrage
A new test method has been implemented for testing the EMC performance of small components like small connectors and IC’s, mainly used in mobile applications. The test method is based on the EMC-stripline method. Both emission and immunity can be tested up to 6GHz, based on good RF matching conditions and with high field strengths.
Boek: Proceedings of EMC Europe 2013, Brugge
Pagina's: 961 - 965
ISBN:9781467349796
Jaar van publicatie:2013
Toegankelijkheid:Open