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Remote excitation-tip-enhanced Raman scattering microscopy using silver nanowire

Tijdschriftbijdrage - Tijdschriftartikel

Tip-enhanced Raman scattering (TERS) microscopy is a promising technique for use in surface analysis, allowing both topographic and spectroscopic information to be obtained simultaneously at a scale below 10 nm. One proposed method to further improve spatial resolution is the use of propagating surface plasmons as an excitation light source (i.e., remote excitation). However, this requires a specialized tip that can only be fabricated via expensive procedures, such as electron-beam lithography. Here, we propose a new method for fabricating silver nanowire-based tips that are suitable for remote excitation-TERS, removing the need for such techniques. A silver nanowire was fixed onto a tungsten-tip using a micromanipulator, before gold nanoparticles were attached in a site-specific manner using AC-dielectrophoresis. All the processes were completed using an optical microscope in the ambient. The background intensities in TERS spectra were suppressed with remote excitation relative to the conventional excitation configuration, indicating an increase in TERS sensitivity.
Tijdschrift: JAPANESE JOURNAL OF APPLIED PHYSICS
ISSN: 0021-4922
Issue: 8
Volume: 55
Jaar van publicatie:2016
BOF-keylabel:ja
IOF-keylabel:ja
BOF-publication weight:0.5
CSS-citation score:1
Auteurs:International
Authors from:Higher Education
Toegankelijkheid:Closed