Publicatie

Carrier lifetime spectroscopy for defect characterization in semiconductor materials and devices

Tijdschrift: ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY

ISSN: 2162-8769

Issue: 4

Volume: 5

Pagina's: P3108 - P3137

BOF-keylabel:ja

IOF-keylabel:ja

BOF-publication weight:0.1

CSS-citation score:2

Auteurs:International

Authors from:Government

Toegankelijkheid:Closed