< Terug naar vorige pagina
Publicatie
Study of nanocomposites with XPS
Boekbijdrage - Boekabstract Conferentiebijdrage
XPS was used as an evalution tool for nanoparticles in HTSC thin films. Ar-sputtering was used for depthprofiling and as such it was shown that this is a useful tool to evaluate the distribution of the nanoparticles within the thin film.
Boek: XPS, 11th Annual user meeting, Abstracts
Aantal pagina's: 1
Jaar van publicatie:2015