Onderzoeker
Jan De Beenhouwer
- Disciplines:Scientific computing, Computertheorie, Computer hardware, Andere computer ingenieurswetenschappen, informatietechnologie en mathematische ingenieurswetenschappen, Elektronica
Affiliaties
- Vakgroep Elektronica en Informatiesystemen (Departement)
Lid
Vanaf1 sep 2003 → 30 sep 2012
Publicaties
1 - 10 van 20
- Fast GATE fan beam SPECT projector(2011)
Auteurs: Jan De Beenhouwer, Bart Pieters, Rik Van de Walle
Pagina's: 4188 - 4191 - Micro-CT contrast increase using regularized CT reconstruction(2011)
Auteurs: Bert Vandeghinste, Bart Goossens, Christian Vanhove, Jan De Beenhouwer, Roel Van Holen, Stefaan Vandenberghe, Steven Staelens, M Nyssen
Aantal pagina's: 1 - Accurate Monte Carlo modelling of the back compartments of SPECT cameras(2011)
Auteurs: Erwann Rault, Steven Staelens, Roel Van Holen, Jan De Beenhouwer, Stefaan Vandenberghe
Pagina's: 87 - 104 - Absolute quantification in multi-pinhole micro-SPECT for different isotopes(2011)
Auteurs: Bert Vandeghinste, Christian Vanhove, Jan De Beenhouwer, Roel Van Holen, Stefaan Vandenberghe, Steven Staelens
Pagina's: 3720 - 3724 - Comparison of yttrium-90 SPECT and PET images(2010)Volume: 51
Auteurs: Erwann Rault, Enrico Clementel, Stefaan Vandenberghe, Yves D'Asseler, Roel Van Holen, Jan De Beenhouwer, Steven Staelens
Pagina's: 35 - 35 - Imaging Y-90 with microspect and microspect(2010)
Auteurs: Stefaan Vandenberghe, Steven Deleye, Jan De Beenhouwer, Larry van Elmbt, Steven Staelens, Bieke Lambert, Stephan Walrand
Aantal pagina's: 1 - Fast gate multi-pinhole SPECT simulations(2010)
Auteurs: Jan De Beenhouwer, Steven Staelens
Pagina's: 3634 - 3637 - Fast 3D iterative image reconstruction for SPECT with rotating slat collimators(2009)
Auteurs: Roel Van Holen, Stefaan Vandenberghe, Steven Staelens, Jan De Beenhouwer, Ignace Lemahieu
Pagina's: 715 - 729 - Physics process level discrimination of detections for GATE: assessment of contamination in SPECT and spurious activity in PET(2009)
Auteurs: Jan De Beenhouwer, Steven Staelens, Stefaan Vandenberghe, Jeroen Verhaeghe, Roel Van Holen, Erwann Rault, Ignace Lemahieu
Pagina's: 053 - 1060 - Scatter effects of MR components in PET-MR inserts(2009)
Auteurs: Vincent Keereman, Stefaan Vandenberghe, Jan De Beenhouwer, Roel Van Holen, Steven Staelens, Volkmar Schulz, Torsten Solf, Bo Yu
Pagina's: 3804 - 3807