Onderzoeker
Alvaro Jorge Peñas
- Disciplines:Biomechanica
Affiliaties
- Biomechanica (BMe) (Afdeling)
Lid
Vanaf1 aug 2020 → 30 apr 2020 - Afdeling Biomechanica (Afdeling)
Lid
Vanaf1 apr 2013 → 30 apr 2020
Publicaties
1 - 10 van 11
- Matrix deformations around angiogenic sprouts correlate to sprout dynamics and suggest pulling activity(2020)
Auteurs: Marie-Mo Vaeyens, Alvaro Jorge Peñas, Jorge Barrasa Fano, Christian Steuwe, Peter Carmeliet, Maarten Roeffaers, Hans Van Oosterwyck
Pagina's: 315 - 324 - Fast quantitative time lapse displacement imaging of endothelial cell invasion.(2020)
Auteurs: Christian Steuwe, Marie-Mo Vaeyens, Alvaro Jorge Peñas, Célie Cokelaere, Johan Hofkens, Maarten Roeffaers, Hans Van Oosterwyck
Pagina's: e0227286 - e0227286 - Spatiotemporal analyses of cellular tractions describe subcellular effect of substrate stiffness and coating(2019)
Auteurs: Alicia Izquierdo-Alvarez, Diego Vargas Arango, Alvaro Jorge Peñas, Marie-Mo Vaeyens, Hans Van Oosterwyck
Pagina's: 624 - 637 - Combustion-derived particles inhibit in vitro human lung fibroblast-mediated matrix remodeling.(2018)
Auteurs: Hannelore Bové, Maarten Roeffaers, Alvaro Jorge Peñas, Hans Van Oosterwyck
- Super-resolved Traction Force Microscopy over Whole Cells(2017)
Auteurs: Alvaro Jorge Peñas, Hans Van Oosterwyck
Pagina's: 40 - 43 - Biomechanical characterization of ascending aortic aneurysms(2017)
Auteurs: Marija Smoljkic, Heleen Fehervary, Alvaro Jorge Peñas, Steven Dymarkowski, Peter Verbrugghe, Bart Meuris, Jos Vander Sloten, Nele Famaey
Pagina's: 705 - 720 - Biomechanical characterization of ascending aortic aneurysms(2017)
Auteurs: Marija Smoljkic, Heleen Fehervary, Philip Van den Bergh, Alvaro Jorge Peñas, Louis Kluyskens, Steven Dymarkowski, Peter Verbrugghe, Bart Meuris, Nele Famaey
Pagina's: 705 - 720 - Full L-1-regularized Traction Force Microscopy over whole cells(2017)
Auteurs: Alvaro Jorge Peñas, Hans Van Oosterwyck
- L1-Regularized Reconstruction for Traction Force Microscopy(2016)
Auteurs: Alvaro Jorge Peñas, Hans Van Oosterwyck
Pagina's: 140 - 144 - Free Form Deformation -based Image Registration Improves Accuracy of Traction Force Microscopy(2015)
Auteurs: Alvaro Jorge Peñas, Alicia Izquierdo-Alvarez, Hans Van Oosterwyck